Conference
Khader Abdel-Hafez, Salem Abdennadher, Erkan Acar, Dhruva Acharyya, Saman Adham, Vishwani Agrawal, Robert Aitken, Chouki Aktouf, Zaid Al-Ars, Hussain Al-Asaad, Mohammad Ali-Bakhshian, Bijan Alizadeh, Sobeeh Almukhaizim, Meryem Alpaslan, Juergen Alt, Martin Amodeo, Enamul Amyeen, Dong An, Lorena Anghel, Sadok Aouini, Dave Armstrong, Ralf Arnold, Daniel Arumí, Yoshiaki Asao, Albert Au, Charles Bachand, Iris Bahar, Kedarnath Balakrishnan, Nadir Basturkmen, Bernd Becker, Serge Bernard, Sandeep Bhatia, Dilip Bhavsar, Sudipta Bhawmik, Swarup Bhunia, Sounil Biswas, Sucharita Biswas, Shawn Blanton, Dan Bodoh, Alberto Bosio, Ahcene Bounceur, Kenneth Butler, Yi Cai, Darrell Carder, Freescale Semiconductors, Gunnar Carlsson, John Carulli, Krishnendu Chakrabarty, Tapan Chakraborty, Krishna Chakravadhanula, Sreejit Chakravarty, Victor Champac, Anshuman Chandra, Hsiu-Ming Chang, Shih-Chieh Chang, Yi-Shing Chang, Mango Chao, Abhijit Chatterjee, Degang Chen, Mingjing Chen, Tim Cheng, Wu-Tung Cheng
2011 IEEE International Test Conference
Year of publication : 2011